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The structure of Sb(111) determined by photoelectron diffractionBENGIO, S; WELLS, J. W; KIM, T. K et al.Surface science. 2007, Vol 601, Num 14, pp 2908-2911, issn 0039-6028, 4 p.Article

Photoelectron spectroscopy (PES) and photoelectron diffraction (XPD) studies on the local adsorption of cyclopentene on Si(100)WEIER, D; LÜHR, T; BEIMBORN, A et al.Surface science. 2010, Vol 604, Num 19-20, pp 1608-1613, issn 0039-6028, 6 p.Article

The structure and bonding of furan on Pd(111)BRADLEY, M. K; ROBINSON, J; WOODRUFF, D. P et al.Surface science. 2010, Vol 604, Num 11-12, pp 920-925, issn 0039-6028, 6 p.Article

Polarity of wurtzite crystals by photoelectron diffractionBARTOS, I; ROMANYUK, O.Applied surface science. 2014, Vol 315, pp 506-509, issn 0169-4332, 4 p.Conference Paper

Direct surface-structure analysis by the peak rotation in circularly polarized light photoelectron diffractionDAIMON, Hiroshi; IMADA, Shin; SUGA, Shigemasa et al.Surface science. 2001, Vol 471, Num 1-3, pp 143-150, issn 0039-6028Article

Advances in direct and diffraction methods for surface structural determinationTONG, S. Y.Surface science. 1999, Vol 433-35, pp 32-39, issn 0039-6028Article

Comment on: Structural analysis of the SiO2/Si(100) interface by means of photoelectron diffraction. Authors' replyBONGIORNO, Angelo; PASQUARELLO, Alfredo; DREINER, S et al.Physical review letters. 2005, Vol 94, Num 18, pp 189601.1-189602.1, issn 0031-9007Article

Holographic reconstruction of Si(111) atom positions from energy- and angle-resolved photoelectron diffractionWESTPHAL, C; DREINER, S; SCHÜRMANN, M et al.Surface science. 2000, Vol 462, Num 1-3, pp 103-122, issn 0039-6028Article

Quantitative determination of the local structure of thymine on Cu( 110) using scanned-energy mode photoelectron diffractionALLEGRETTI, F; POLCIK, M; WOODRUFF, D. P et al.Surface science. 2007, Vol 601, Num 17, pp 3611-3622, issn 0039-6028, 12 p.Article

Photoelectron diffraction structure determination of Cu(100)c(2 × 2)-NHOEFT, J. T; POLCIK, M; KITTEL, M et al.Surface science. 2001, Vol 492, Num 1-2, pp 1-10, issn 0039-6028Article

A new algorithm for path exploration in photoelectron diffractionGAVAZA, Mihai; SEBILLEAU, Didier.Surface science. 2001, Vol 482-85, pp 1463-1467, issn 0039-6028, 2Conference Paper

Global search algorithms in surface structure determination using photoelectron diffractionDUNCAN, D. A; CHOI, J. I. J; WOODRUFF, D. P et al.Surface science. 2012, Vol 606, Num 3-4, pp 278-284, issn 0039-6028, 7 p.Article

Full-potential multiple scattering for core electron spectroscopiesHATADA, Keisuke; HAYAKAWA, Kuniko; BENFATTO, Maurizio et al.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 10, issn 0953-8984, 104206.1-104206.12Conference Paper

Angle-dependent oscillations in valence-band photoemission intensity of C60HE, S; ARITA, M; NAMATAME, H et al.Journal of physics. Condensed matter (Print). 2007, Vol 19, Num 2, issn 0953-8984, 026202.1-026202.8Article

Structural analysis of Pt(111 )c(√3 x 5)rect.-CO using photoelectron diffractionNISBET, G; LAMONT, C. L. A; POLCIK, M et al.Surface science. 2007, Vol 601, Num 5, pp 1296-1303, issn 0039-6028, 8 p.Article

Multiple scattering investigation of the 1T-TaS2 surface terminationDESPONT, L; CLERC, F; GARNIER, M. G et al.The European physical journal. B, Condensed matter physics. 2006, Vol 52, Num 3, pp 421-426, issn 1434-6028, 6 p.Article

Adsorption bond length for H2O on TiO2(110) : A key parameter for theoretical understandingALLEGRETTI, F; O'BRIEN, S; POLCIK, M et al.Physical review letters. 2005, Vol 95, Num 22, pp 226104.1-226104.4, issn 0031-9007Article

Is PEXAFS really PhD?TOOMES, R. L; WOODRUFF, D. P; POLCIK, M et al.Surface science. 2000, Vol 445, Num 2-3, pp 300-308, issn 0039-6028Article

The structure of the V2O3(0001) surface : A scanned-energy mode photoelectron diffraction studyKRÖGER, E. A; SAYAGO, D. I; ALLEGRETTI, F et al.Surface science. 2007, Vol 601, Num 16, pp 3350-3360, issn 0039-6028, 11 p.Article

Doping-induced reorientation of C60 molecules on Ag(111)TAMAR, A; SEITSONEN, A. P; FASEL, R et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 8, pp 085421.1-085421.5, issn 1098-0121Article

Chemical-state specificity in surface structure determinationWOODRUFF, D. P.Applied physics. A, Materials science & processing (Print). 2001, Vol 72, Num 4, pp 421-428, issn 0947-8396Article

The local adsorption geometry of benzene on Ni(110) at low coverageKANG, J.-H; TOOMES, R. L; ROBINSON, J et al.Surface science. 2000, Vol 448, Num 1, pp 23-32, issn 0039-6028Article

XPD and STM investigation of hexagonal boron nitride on ni(111)AUWÄRTER, W; KREUTZ, T. J; GREBER, T et al.Surface science. 1999, Vol 429, Num 1-3, pp 229-236, issn 0039-6028Article

6H-SiC{0001} X-ray photoelectron diffraction characterization used for polarity determinationBISCHOFF, J. L; DENTEL, D; KUBLER, L et al.Surface science. 1998, Vol 415, Num 3, pp 392-402, issn 0039-6028Article

Energy scan photoelectron diffraction : An integrated method for adsorbate structure determinationsSCHINDLER, K.-M.Applied physics. A, Materials science & processing (Print). 1996, Vol 63, Num 6, pp 605-611, issn 0947-8396Article

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